Open access peer-reviewed Edited Volume

X-Ray Spectroscopy

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Academic Editor

Shatendra K Sharma
Shatendra K Sharma

Jawaharlal Nehru University,
India

Published01 February 2012

Doi10.5772/1422

ISBN978-953-307-967-7

eBook (PDF) ISBN978-953-51-4946-0

Copyright year2012

Number of pages292

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Table of Contents

Open access  chapters

1. X-Ray Spectroscopy Tools for the Characterization of Nanoparticles

By Murid Hussain, Guido Saracco and Nunzio Russo

3,412
2. A Practical Application of X-Ray Spectroscopy in Ti-Al-N and Cr-Al-N Thin Films

By Leonid Ipaz, William Aperador, Julio Caicedo, Joan Esteve and Gustavo Zambrano

3,110
7
2,862
6. The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science

By Frédéric Christien, Edouard Ferchaud, Pawel Nowakowski and Marion Allart

4,539
2
7. Chemical Quantification of Mo-S, W-Si and Ti-V by Energy Dispersive X-Ray Spectroscopy

By Carlos Angeles-Chavez, Jose Antonio Toledo-Antonio and Maria Antonia Cortes-Jacome

3,625
3
8. Quantification in X-Ray Fluorescence Spectrometry

By Rafał Sitko and Beata Zawisza

10,756
20
10. Employing Soft X-Rays in Experimental Astrochemistry

By Sergio Pilling and Diana P. P. Andrade

2,757
11. X-Ray Analysis on Ceramic Materials Deposited by Sputtering and Reactive Sputtering for Sensing Applications

By Rossana Gazia, Angelica Chiodoni, Edvige Celasco, Stefano Bianco and Pietro Mandracci

4,418

IMPACT OF THIS BOOK AND ITS CHAPTERS

53,330 Total Chapter Downloads

1,998 Total Chapter Views

37 Crossref Citations

63 Web of Science Citations

90 Dimensions Citations

6 Altmetric Score

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