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This lecture note covers the following topics: CMOS Technology and Passive Devices, MOS Models for Analog Design, MOS Small-Signal Models for Design , Electronic Noise, Electronic Noise, Noise Analysis, Amplifiers, Single-Ended and Differential OTA, Folded Cascode OTA, Common-Mode Feedback, Multistage Amplifiers, Comparators, MOS Sample and Hold, Biasing, Offset Cancellation.
Author(s): Lingkai Kong
NAPages
This lecture note explains the following topics: Sets, probability, Bayes theorem,Set operations, logic operations, Bernoulli Trials, Cumulative Distribution Function, Thermal distributions, Coupled Systems , Boltzmann Law , random variables and Expectations, random processes, Shot Noise , DC current and Noise Current, Diffusion Noise , Bipolar Transistor Noise, noise of other devices, FETnoise, circuit noise analysis, 2-port noise, mixers and frequency conversion, baseband, AM, FM receivers, Phase noise in oscillators, sensitive measurements, digital communications, Optical receiver sensistivity and sketch of information theory.
Author(s): Prof. Mark Rodwell
NAPages
This note teaches the fundamentals of basic semiconductor devices: the pn-junction diode, the bipolar junction transistor, the metal-oxide-semiconductor capacitor, and the field-effect transistor. Topics covered includes: Semiconductor Fundamentals, Metal-Semiconductor Contacts and Schottky Diodes, pn Junction Diode, Bipolar Junction Transistor, Metal-Oxide-Semiconductor Capacitor , MOS Field-Effect Transistor.
Author(s): Prof Tsu-Jae King
NAPages
This lecture note covers the following topics: CMOS Circuits, CMOS logic design and design representations, Circuit and System Representation, Structural and Physical Representation, Operating Principles of MOS Transistors, Fabrication of CMOS Integrated Circuits and Circuit Characterization.
Author(s): Dr. Roy Paily Palathinkal
NAPages
This note covers the following topics: Optical Communications, Elemental Semiconductors, Metal semiconductor contacts, Electron Microscopy and Analysis, Magnetic Storage Technology, Scanning Probe Microscopy.
Author(s): California institute of technology
NAPages
This note covers the following topics: physical structure of devices, device structure through fabrication sequence, basic processing steps used in fabricating integrated devices, then the use of these process steps in fabricating a diode, bipolar junction transistor or FET.
Author(s): Tom Smy
134Pages
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Currently this section contains no detailed description for the page, will update this page soon.
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Currently this section contains no detailed description for the page, will update this page soon.
Author(s): NA
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Currently this section contains no detailed description for the page, will update this page soon.
Author(s): NA
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Currently this section contains no detailed description for the page, will update this page soon.
Author(s): NA
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